Hiroshi, Irihama : rechercher sur Z-Library

Le plus grand référentiel d'articles scientifiques au monde. 70,000,000+ d'articles gratuitement.

Don't use scam websites

Livres
Articles (7)
Les plus populaires
Liste
- Liste
- Tableau

1

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Aerial image sensor: in-situ scanner aberration monitor

Tyminski, Jacek K., Archie, Chas N., Hagiwara, Tsuneyuki, Kondo, Naoto, Irihama, Hiroshi

Année:

2006

Langue:

english

Fichier:

PDF, 1.22 MB

english, 2006

2

Sharpening contact resonance spectra in UAFM using Q-control

Kenji Fukuda, Hiroshi Irihama, Toshihiro Tsuji, Keiichi Nakamoto, Kazushi Yamanaka

Journal:

Surface Science

Année:

2003

Langue:

english

Fichier:

PDF, 326 KB

english, 2003

3

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Optical Microlithography XXVII - Imaging control functions of optical scanners

Lai, Kafai, Erdmann, Andreas, Nishinaga, Hisashi, Hirayama, Toru, Fujii, Daiyu, Yamamoto, Hajime, Irihama, Hiroshi, Ogata, Taro, Koizumi, Yukio, Suzuki, Kenta, Fujishima, Yohei, Matsuyama, Tomoyuki, K

Année:

2014

Langue:

english

Fichier:

PDF, 6.64 MB

english, 2014

4

SPIE Proceedings [SPIE NDE For Health Monitoring and Diagnostics - San Diego, CA (Sunday 17 March 2002)] Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems - Ultrasonic atomic force microscopy with real-time mapping of resonance frequency and Q factor

Yamanaka, Kazushi, Irihama, Hiroshi, Tsuji, Toshihiro, Nakamoto, Keiichi, Meyendorf, Norbert, Baaklini, George Y., Michel, Bernd

Année:

2002

Fichier:

PDF, 724 KB

2002

5

SPIE Proceedings [SPIE NDE for Health Monitoring and Diagnostics - San Diego, CA (Sunday 2 March 2003)] Testing, Reliability, and Application of Micro- and Nano-Material Systems - Nanoscale nondestructive evaluation of materials and devices by ultrasonic atomic force microscopy

Yamanaka, Kazushi, Tsuji, Toshihiro, Irihama, Hiroshi, Mihara, Tsuyoshi, Meyendorf, Norbert, Baaklini, George Y., Michel, Bernd

Année:

2003

Langue:

english

Fichier:

PDF, 433 KB

english, 2003

6

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Optical Microlithography XVIII - Development of aerial image based aberration measurement technique

Hagiwara, Tsuneyuki, Smith, Bruce W., Kondo, Naoto, Hiroshi, Irihama, Suzuki, Kosuke, Magome, Nobutaka

Année:

2005

Langue:

english

Fichier:

PDF, 225 KB

english, 2005

7

Observation of Dislocation Behavior in Graphite by Using Ultrasonic Atomic Force Microscopy.

TSUJI, Toshihiro, IRIHAMA, Hiroshi, YAMANAKA, Kazushi

Journal:

JSME International Journal Series A

Année:

2002

Fichier:

PDF, 1008 KB

2002